Stacked test board apparatus with matched impedance for use in e

Details Stacked test board apparatus with matched impedance for use in e Stacked test board apparatus with matched impedance for use in e

1996-10-31

1998-09-01

Karlsen, Ernest F.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

3241581, G01R 3102

Patent

active

058015418

ABSTRACT:
An apparatus for use with electronic device test equipment includes a mother test board with a top surface with a first set of pins extending from it, and a bottom surface for connection to a set of pin electronic cards of electronic device test equipment. The apparatus also includes a daughter test board with a top surface with a connection mechanism to receive an electronic device, and a bottom surface with a second set of pins extending from it. An impedance matching structure is positioned between the mother test board and the daughter test board, the impedance matching structure defines a plurality of apertures positionally aligned with the first set of pins and the second set of pins such that the first set of pins and the second set of pins physically mate within the apertures. The first set of pins, the second set of pins, and the apertures are configured to establish a predetermined constant impedance connection between the mother test board and the daughter test board.

REFERENCES:
patent: 4574236 (1986-03-01), Hechtman
patent: 4724383 (1988-02-01), Hart
patent: 4935696 (1990-06-01), DiPerna

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