Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – Multiple housings
Reexamination Certificate
2006-12-08
2009-02-10
Clark, S. V (Department: 2823)
Active solid-state devices (e.g., transistors, solid-state diode
Housing or package
Multiple housings
C257S724000
Reexamination Certificate
active
07489030
ABSTRACT:
As a defective contact recovery elements, a stacked semiconductor device include a parallel arrangement system in which signal paths are multiplexed, and a defective contact recovery circuit operable to switch a signal path into an auxiliary signal path. The parallel arrangement system is used in a case where the number of signals is small and a very high speed operation is required because of a serial data transfer. The defective contact recovery circuit is used in a case where the number of signals is large because of a parallel data transfer.
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Ijima Tatsuya
Ikeda Hiroaki
Inoue Yoshihiko
Miwa Hitoshi
Shibata Kayoko
Clark S. V
Elpida Memory Inc.
Young & Thompson
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