Semiconductor device manufacturing: process – Bonding of plural semiconductor substrates – Thinning of semiconductor substrate
Reexamination Certificate
2011-01-11
2011-01-11
Pham, Thanhha (Department: 2894)
Semiconductor device manufacturing: process
Bonding of plural semiconductor substrates
Thinning of semiconductor substrate
C438S127000, C257SE21499
Reexamination Certificate
active
07867878
ABSTRACT:
Stacked semiconductor chips are disclosed. One embodiment provides a method including a first substrate having a first surface and an opposing second surface. The first substrate includes an array of first connection elements on the first surface of the first substrate. A second substrate has a first surface and an opposing second surface. The second substrate includes an array of second connection elements on the first surface of the second substrate. The first connection elements is attached to the second connection elements; and is thinning at least one of the first substrate and the second substrate after the attachment of the first connection elements to the second connection elements.
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patent: 2009/0149023 (2009-06-01), Koyanagi
Beer Gottfried
Brunnbauer Markus
Meyer Thorsten
Sezi Recai
Dicke Billig & Czaja, PLLC
Infineon - Technologies AG
Pham Thanhha
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