Stacked metal silicide gate structure with barrier

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

357 231, H01L 2962, H01L 2978

Patent

active

049740563

ABSTRACT:
A gate structure for integrated circuit devices which includes a work function layer, a low resistivity layer, and an electrically conductive barrier layer between the two other layers to prevent the other two layers from intermixing. The work function controlling layer is preferably selected from the group of tungsten, molybdenum, their silicides, or a combination thereof.

REFERENCES:
patent: 3573570 (1971-04-01), Fuller et al.
patent: 3614547 (1971-10-01), May
patent: 3633076 (1972-01-01), Heinz-Herbert et al.
patent: 4263058 (1981-04-01), Brown
patent: 4276557 (1981-06-01), Levinstein
patent: 4445134 (1984-04-01), Miller
patent: 4470189 (1984-09-01), Roberts
patent: 4584207 (1986-04-01), Wilson
J. Cuomo, Selective-Chemical Vapor Deposition of Tungsten, 1972, pp. 270-291, 3d Int'l Conference of Chemical Paper Deposition, American Nuclear Society Proceedings.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Stacked metal silicide gate structure with barrier does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Stacked metal silicide gate structure with barrier, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Stacked metal silicide gate structure with barrier will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1035760

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.