Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2011-06-07
2011-06-07
Nguyen, Ha Tran T (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S754070
Reexamination Certificate
active
07956633
ABSTRACT:
Systems and methods for providing a stack with a guard plane embedded in the stack are disclosed. An electrical apparatus can be made by forming a stack comprising an electrically conductive signal structure, an electrical guard structure, and an electrically insulating structure disposed between the signal structure and the guard structure. The signal structure, insulating structure, and guard structure can be aligned one with another in the stack.
REFERENCES:
patent: 4189825 (1980-02-01), Robillard et al.
patent: 5103557 (1992-04-01), Leedy
patent: 5416429 (1995-05-01), McQuade et al.
patent: 5576630 (1996-11-01), Fujita
patent: 5621333 (1997-04-01), Long et al.
patent: 6215320 (2001-04-01), Parrish
patent: 6292003 (2001-09-01), Fredrickson et al.
patent: 6351133 (2002-02-01), Jones et al.
patent: 6616966 (2003-09-01), Mathieu et al.
patent: 6657130 (2003-12-01), Van Dyke et al.
patent: 6861858 (2005-03-01), Chen et al.
patent: 7068057 (2006-06-01), Tervo et al.
patent: 2005/0068054 (2005-03-01), Mok et al.
patent: 2007/0139061 (2007-06-01), Eldridge et al.
patent: 2008/0143358 (2008-06-01), Breinlinger
FormFactor Inc.
Isla Rodas Richard
Kirton & McConkie
Nguyen Ha Tran T
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