Stacked device conductive path connectivity

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Chip mounted on chip

Reexamination Certificate

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Details

C257S678000, C257S685000, C257S701000

Reexamination Certificate

active

08063491

ABSTRACT:
Various embodiments include apparatus and methods having circuitry to test continuity of conductive paths coupled to dice arranged in a stack.

REFERENCES:
patent: 2008/0296697 (2008-12-01), Hsu et al.

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