Metal treatment – Process of modifying or maintaining internal physical... – With casting or solidifying from melt
Reexamination Certificate
2011-03-22
2011-03-22
Wyszomierski, George (Department: 1733)
Metal treatment
Process of modifying or maintaining internal physical...
With casting or solidifying from melt
C148S425000, C204S298130, C029S527600
Reexamination Certificate
active
07909949
ABSTRACT:
Provided is a surface processing method of a sputtering target, wherein a target surface in which intermetallic compounds, oxides, carbides, carbonitrides and other substances without ductility exist in a highly ductile matrix phase at a volume ratio of 1 to 50% is preliminarily subject to the primary processing of cutting work, then subsequently subject to finish processing via polishing. The sputtering target subject to this surface processing method is able to improve the target surface having numerous substances without ductility, and prevent or suppress the generation of nodules and particles upon sputtering.
REFERENCES:
patent: 4895592 (1990-01-01), Hatwar et al.
patent: 5460793 (1995-10-01), Kano et al.
patent: 6024852 (2000-02-01), Tamura et al.
patent: 6153315 (2000-11-01), Yamakoshi et al.
patent: 6521062 (2003-02-01), Bartholomeusz et al.
patent: 2007/0187236 (2007-08-01), Nakamura et al.
patent: 2007/0215463 (2007-09-01), Parkhe
patent: 06-136524 (1994-05-01), None
patent: 09-228037 (1997-09-01), None
patent: 11-293454 (1999-10-01), None
patent: 2000-199054 (2000-07-01), None
patent: 2002-069623 (2002-03-01), None
patent: 2002-208125 (2002-07-01), None
English translation of Ueno JP 2002-069623, published Mar. 8, 2002, 26 pages total.
English translation of Ueno JP 2002-208125, published Jul. 28, 2002, 23 pages total.
Esp@cenet database, one page English Abstract of JP 03-257158, Nov. 1991.
Hisano Akira
Nakamura Yuichiro
Howson & Howson LLP
JX Nippon Mining & Metals Corporation
Shevin Mark L
Wyszomierski George
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