Chemistry: electrical and wave energy – Apparatus – Coating – forming or etching by sputtering
Reexamination Certificate
2006-07-03
2011-10-04
Young, Christopher (Department: 1721)
Chemistry: electrical and wave energy
Apparatus
Coating, forming or etching by sputtering
C264S109000, C419S019000
Reexamination Certificate
active
08029655
ABSTRACT:
Provided is a sputtering target which can give a high water barrier property and a high flexibility to a sputtering film, can keep a high film forming rate certainly in sputtering, and can make damages to an objective substance wherein a film is to be formed as small as possible. In order to realize this, a mixed powder which contains 20 to 80% by weight of a SiO powder, the balance of the powder being made of a TiO2powder and/or a Ti powder, is pressed and sintered. The sintered body has a composition of SiαTiβOγ wherein α, β and γ are mole ratios of Si, Ti and O, respectively, and the ratio of α/β ranges from 0.45 to 7.25 and the ratio of γ/(α+β) ranges from 0.80 to 1.70.
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Azuma Kazuomi
Kido Jyunji
Mori Koichi
Natsume Yoshitake
Ogasawara Tadashi
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
OSAKA Titanium technologies Co., Ltd.
ROHM Co. Ltd.
Young Christopher
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