Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-09-17
2009-08-11
Raymond, Edward (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S058000, C702S117000, C714S030000, C714S055000, C714S819000
Reexamination Certificate
active
07574314
ABSTRACT:
A circuit for a data processing apparatus and a method for detecting spurious signals is disclosed, the circuit comprising a data input operable to receive digital signal values, spurious signal detection logic operable to monitor a digital signal value within the circuit, and to determine at least one of: a safe time window during which it is expected that the digital signal values input into the circuit may cause data transitions in the monitored digital signal value and a transition time window in which it is expected a data transition will occur; and in response to detecting either a data transition in the monitored digital signal value outside of the at least one safe time window or no data transition in the transition window, the spurious signal detection logic is operable to output a detection signal.
REFERENCES:
patent: 3699554 (1972-10-01), Jones
patent: 6774823 (2004-08-01), Schafferer
patent: 2004/0123137 (2004-06-01), Yodaiken
patent: 2005/0222789 (2005-10-01), West
Moll et al., ‘Methodology of Detection of Spurious Signals in VLSI Circuits’, 1993, IEEE Publication, pp. 491-496.
Pudov, ‘Elimination of Spurious Signal due to Misalignment of Magnetic Axes of a Differential Magnetic-Modulation Transducer’, 2000, RJNT Publication, pp. 1-8.
Search Report for related application No. GB0621056.1 dated Dec. 22, 2006.
Bull David Michael
Ford Simon Andrew
Reid Alastair David
ARM Limited
Desta Elias
Nixon & Vanderhye P.C.
Raymond Edward
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