Spring probe BGA (ball grid array) contactor with device stop an

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

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Details

439 71, 324754, 324758, H01R 1362, G01R 104

Patent

active

055700330

ABSTRACT:
The present invention relates to a spring probe contactor for testing BGA devices. The spring probe contactor is comprised of a plurality of spring probes for providing a connection between a BGA device to be tested and a DUT board. The plurality of spring probes are held within a contactor block having a plurality of apertures therethrough. The apertures are wide enough to hold a single spring probe within the contactor block without the spring probe coming into contact with the contactor block. A retaining plate is coupled to the contactor block for holding the plurality of spring probes within the contactor block. The retaining plate has a raised portion thereon which limits the compression of the plurality of spring probes when a BGA device is placed in the spring probe contactor.

REFERENCES:
patent: 5376010 (1994-12-01), Petersen
patent: 5400220 (1994-05-01), Swamy
patent: 5418471 (1995-05-01), Kardos
patent: 5419710 (1995-05-01), Pfaff

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