Spring probe and method for biasing

Details Spring probe and method for biasing Spring probe and method for biasing

1997-01-16

1998-09-01

Karlsen, Ernest F.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324754, G01R 3102

Patent

active

058015442

ABSTRACT:
A spring-loaded contact probe for performing tests on an electrical device. The probe includes an elongated plunger having an end with a convex surface retained within a barrel. A spring for applying an axial load is positioned within the barrel and a ball sized to translate a portion of the axial force into a side loading force is positioned between the spring and the convex surface of the plunger. The spring has a tightly wound coil adjacent the ball for maintaining the ball against the barrel.

REFERENCES:
patent: 566655 (1896-09-01), Johnston
patent: 3435168 (1969-03-01), Cooney
patent: 4397519 (1983-08-01), Cooney
patent: 4560223 (1985-12-01), Cooney et al.
patent: 4885533 (1989-12-01), Coe
patent: 4904935 (1990-02-01), Calma et al.
patent: 5175493 (1992-12-01), Langgard

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