Spring-loaded electrical contact probe

Details Spring-loaded electrical contact probe Spring-loaded electrical contact probe

1994-12-01

1996-09-17

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324754, G01R 106

Patent

active

055572138

ABSTRACT:
An electrical spring probe includes a barrel having an annular opening therethrough. A plunger is partially disposed within the annular opening at one end and is capable of slidable axial displacement within the annular opening. The plunger includes a tip positioned outside of the barrel for contacting an electrical device. A terminal member is disposed within the annular opening through the barrel at an end opposite to the plunger and is fixedly attached therein. The terminal member includes a flanged end that is positioned outside of the barrel and includes at least one flange that extends radially outward from the flanged end. The flange has a shoulder that is substantially perpendicular to an axis running along the terminal member. A slot is positioned in the flanged end and extends axially along the terminal member from tip of the flanged end a distance toward the barrel. The spring probe forms a locked attachment with a probe receptacle by a snap locking abutment of the shoulder of each flange with an outside edge of an opening in a terminal portion of the receptacle.

REFERENCES:
patent: 3223960 (1965-12-01), Ruehlemann
patent: 3761871 (1973-09-01), Tawlings
patent: 4560926 (1985-12-01), Cornu et al.
patent: 4904935 (1990-02-01), Calma et al.
patent: 4918384 (1990-04-01), Giringer et al.
patent: 4935696 (1990-06-01), DiPerna
patent: 5387138 (1995-02-01), O'Malley

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