Optics: measuring and testing – Of light reflection
Reexamination Certificate
2005-03-15
2005-03-15
Stafira, Michael P. (Department: 2877)
Optics: measuring and testing
Of light reflection
Reexamination Certificate
active
06867865
ABSTRACT:
SPR sensor, in particular for detection of a layer of material, essentially consisting of a source for coherent monochromatic electromagnetic waves, a medium with a tunable index of refraction, and an imaging detection system, wherein the medium is designed as an optical resonator that has a first and a second opposing end face, upon each of which is applied at least one coating that is suitable for producing surface plasmon resonances, and wherein the imaging detection system has a polarization device and is designed such that at least one ellipsometric quantity produced by the SPR sensor in the reflected part of the incident coherent monochromatic electromagnetic wave can be detected.
REFERENCES:
patent: 5926284 (1999-07-01), Naya et al.
patent: 6577396 (2003-06-01), Naya
patent: 0 577 285 (1994-01-01), None
S. Shen et al., Optical Phase-Shift detection of surface plasmon resonance, Apr. 1, 1998, Applied Optics, vol. 37, No. 10, pp. 1747-1751.*
V. Vaicikauskas et al.: Leth. Phys J., vol. 39, No. 4, 1999, pp. 263-272, XP001017808.
S. G. Nelson et al.: Sensor and Actuators B, vol. 35, 1996, pp. 187-191, XP004049753.
A. A. Kruchinin and Yu. G. Vlasov: Sensors and Actuatros B, vol. 30, 1996, pp. 77-80, XP000584898.
Birch & Stewart Kolasch & Birch, LLP
Nanofilm Technologie GmbH
Stafira Michael P.
Valentin Juan D
LandOfFree
SPR sensor does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with SPR sensor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and SPR sensor will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3377920