Optics: measuring and testing – Of light reflection
Reexamination Certificate
2006-08-01
2006-08-01
Toatley, Gregory (Department: 2877)
Optics: measuring and testing
Of light reflection
C356S495000, C356S491000
Reexamination Certificate
active
07084980
ABSTRACT:
The present invention concerns an interferometer comprising: an optical body adapted in operation to mount a measurement area comprising a film which is capable of acting as a two dimensional environment for surface plasmons and an adjacent reference area; an optical beam generation means for irradiating the reference and measurement areas with radiation capable of generating surface plasmon resonance; optical means for combining radiation reflected from the reference and measurement areas, and pixelated detection means for generating data representing two dimensional images of the combined radiation beams.
REFERENCES:
patent: 5485277 (1996-01-01), Foster
patent: 5999262 (1999-12-01), Dobschal et al.
patent: 198 14 811 C 1 (1999-08-01), None
patent: WO 93/14392 (1993-07-01), None
patent: WO 95/22754 (1995-08-01), None
patent: WO 01/20295 (2001-03-01), None
S.G. Nelson, et al. “High sensitivity surface plasmon resonance sensor based on phase detection.” Sensors and Actuators B, Elsevier Sequoia Science S.A., Lausanne, CH, vol. 35, No. 1, Sep. 1, 1996, pp. 187-191, XP004049753, ISSN: 0925-4005.
Hazel Michael
Jones Robert
Roberts Gavin
Blakely & Sokoloff, Taylor & Zafman
Cambridge Consultants Limited
De Klerk Stephen M.
Detschel Marissa J
Toatley Gregory
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