Splice inspection method and apparatus using light inclined at a

Radiant energy – Photocells; circuits and apparatus – Optical or pre-photocell system

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250223R, 356429, G06K 710

Patent

active

048702919

ABSTRACT:
A method for inspecting a tape splice for defects in which the splice region between two sheets is irradiated with a light beam, the tapes are longitudinally conveyed relative to the light beam, a one-dimensional light detector means receives the portion of the light beam transmitted or reflected by a linear region of the sheets inclined at a prescribed angle to the transverse direction of the sheets, and the presence/absence of a splice defect is discriminated from change or lack of change in the quantity of light received by the light detector means; and an apparatus for carrying out this method.

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patent: 4611907 (1986-09-01), Inatsuki
patent: 4652124 (1987-03-01), Bowen et al.
patent: 4687321 (1987-08-01), Itoh
patent: 4687943 (1987-08-01), Bowen et al.

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