Measuring and testing – Testing of apparatus
Reexamination Certificate
2006-11-07
2006-11-07
Noland, Thomas P. (Department: 2856)
Measuring and testing
Testing of apparatus
C324S212000, C360S294400
Reexamination Certificate
active
07131346
ABSTRACT:
Head stack fixtures for securing head stack assemblies to spin stand testing systems, and spin stand testing systems incorporating such fixtures, are disclosed. Exemplary head stack fixtures comprise a base supporting a piezoelectric actuator. The base includes an attachment mechanism for securing the HSA in such a way that the HSA will pivot relative to the base. When the HSA is secured to the base, the piezoelectric actuator engages the HSA. The piezoelectric actuator is therefore able to pivot the HSA relative to the base for fine positioning of a head of the HSA.
REFERENCES:
patent: 6140815 (2000-10-01), Greene et al.
patent: 6166536 (2000-12-01), Chen et al.
patent: 6216242 (2001-04-01), Schaenzer
patent: 6226767 (2001-05-01), Sundaram
patent: 6229664 (2001-05-01), Albrecht et al.
patent: 6242910 (2001-06-01), Guzik et al.
patent: 6262572 (2001-07-01), Franco et al.
patent: 6265868 (2001-07-01), Richter
patent: 6267004 (2001-07-01), Ku et al.
patent: 6292316 (2001-09-01), Dietzel et al.
patent: 6296552 (2001-10-01), Boutaghou et al.
patent: 6366416 (2002-04-01), Meyer et al.
patent: 6373243 (2002-04-01), Takano et al.
patent: 6459260 (2002-10-01), Bonin et al.
patent: 6483300 (2002-11-01), Severson et al.
patent: 6510752 (2003-01-01), Sacks et al.
patent: 6531867 (2003-03-01), Greene et al.
patent: 6538838 (2003-03-01), Sacks et al.
patent: 6556006 (2003-04-01), Li et al.
patent: 6566870 (2003-05-01), Sorenson et al.
patent: 6580572 (2003-06-01), Yao et al.
patent: 6608477 (2003-08-01), Sacks et al.
patent: 6653809 (2003-11-01), Nakatani
patent: 6696831 (2004-02-01), Nozu
patent: 2002/0049104 (2002-04-01), Ito
patent: 2004/0130320 (2004-07-01), Guzik et al.
patent: 2006/0066300 (2006-03-01), Che et al.
patent: 2006/0103382 (2006-05-01), Mihara et al.
patent: 08161717 (1996-06-01), None
patent: WO 9958995 (1999-11-01), None
patent: WO 2004027760 (2004-04-01), None
patent: WO 2004027761 (2004-04-01), None
Che, Xiaodong, et al., “Utilization of Continuous PES Signal for H/M Component Characterizations,” INTERMAG 2003—The 2003 IEEE International Magnetics Conference (Mar. 30-Apr. 3, 2003), Boston, Massachusetts, pp. 1-3.
Guzik Technical Enterprises, Spinstand S-1701 User's Manual, Revision 2.1, PN: 02-103653-02, pp. i-iii and 5-88, by Oct. 2004.
Buttar Jagdeep S.
Che Xiaodong
Davies Kenneth R.
Ferrier Herman
Terrill David
Carr & Ferrell LLP
Harrison, Esq. Joshua C.
Noland Thomas P.
Western Digital (Fremont) Inc.
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