Spin microscope based on optically detected magnetic resonance

Details Spin microscope based on optically detected magnetic resonance Spin microscope based on optically detected magnetic resonance

2007-08-28

2010-06-29

Raevis, Robert R (Department: 2856)

Measuring and testing

Surface and cutting edge testing

Roughness

Reexamination Certificate

active

07743648

ABSTRACT:
The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of unpaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.

REFERENCES:
patent: 5479024 (1995-12-01), Hillner et al.
D. Rugar, C.S. Yannoini, and J.A. Sidles, Nature, 360, 563, Reference [1], Dec. 1992.
G.T. Shubeita, S.K. Seikatskii, G Dietler, and V.S. Letokohov, Appl. Phys. Lett. 80, 2625-2627, Reference [6], Apr. 2002.

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