Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate
2007-12-11
2007-12-11
Raevis, Robert (Department: 2856)
Measuring and testing
Surface and cutting edge testing
Roughness
C324S300000
Reexamination Certificate
active
11102626
ABSTRACT:
The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of unpaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.
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Berman Gennady P.
Chernobrod Boris M.
Durkis James C.
Gottlieb Paul A.
O'Dwyer Thomas S.
Raevis Robert
U. S. Department of Energy
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