Spike suppression for a tester circuit for integrated circuits

Details Spike suppression for a tester circuit for integrated circuits Spike suppression for a tester circuit for integrated circuits

1993-06-15

1995-10-31

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 731, 324115, G01R 3128, G01R 1508

Patent

active

054633150

ABSTRACT:
Pin electronics for an IC tester are built as an integrated circuit for testing the electrical operation of a device under test (DUT) by applying a test voltage to each of the pins on the DUT and measuring each resulting current. Typically, when the tester switches between the internal measure resistors, a voltage spike occurs on the pin of the DUT of a magnitude that may severely damage the sensitive circuitry on the DUT. Voltage spike suppression is included in the circuitry to minimize the effects on the DUT of voltage spikes.

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patent: 5101501 (1992-03-01), Gilhousen et al.
patent: 5267261 (1993-11-01), Blakeney, II et al.
patent: 5319254 (1994-06-01), Goetting

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