Electricity: measuring and testing – Magnetic – Calibration
Patent
1989-09-19
1991-06-04
Strecker, Gerard R.
Electricity: measuring and testing
Magnetic
Calibration
29834, 29841, 174 522, 32420721, 324252, 324174, 38 32R, G01R 3500, G01R 3306, G01P 3488, H05K 1304
Patent
active
050217364
ABSTRACT:
A transducer arrangement comprising a magnetoresistive transducer including a magnetoresistive element responsive to magnetic flux passing therethrough in a predetermined direction to change its electrical resistance as a function of the intensity of the magnetic flux in the predetermined direction and a magnet to provide said magnetic flux. The transducer can include a permanent magnet having a planar surface with a magnetoresistive element offset from the axis of the magnet and optionally at an angle to the planar surface. The transducer can also include a concave surfaced magnet with the magnetoresistive element at an acute angle to the parallel flux lines emanating from the concave surface. As a further embodiment, the magnetoresistive element can be tilted on the magnet surface in two directions to provide a bias field and calibration. As a third embodiment, a high permeability pole piece can be positioned on the magnet surface between the magnet and the magnetoresistive element to minimize field variation due to nonuniformities in the magnet. There is also provided a module including an aluminum bracket mountable at the fore portion thereof and containing a magnetoresistive transducer circuit at the aft portion thereof, the circuit being coupled to a semiconductor circuit disposed at the center of the bracket. An epoxy resin encases the transducer circuit and semiconductor circuit as well as an optional cable or electrical connector at the fore portion of the bracket.
REFERENCES:
patent: 3613000 (1971-10-01), Weir et al.
patent: 4506217 (1985-03-01), Rothley et al.
patent: 4712064 (1987-12-01), Eckardt et al.
patent: 4725776 (1988-02-01), Onodera et al.
patent: 4754221 (1988-06-01), Ao et al.
patent: 4935698 (1990-06-01), Kawaji et al.
Beringhause Steven
Gonsalves Edward M.
Offiler Stephen B.
Strott Douglas B.
Haug John A.
McAndrews James P.
Sharp Melvin
Strecker Gerard R.
Texas Instruments Incorporated
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