Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-08-07
2007-08-07
Nghiem, Michael (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S028000
Reexamination Certificate
active
11119147
ABSTRACT:
A method for determining the most likely composition of a sample, including obtaining data from a sample, wherein the data includes a representation of a measured spectrum; determining the precision state of the representation of the measured spectrum; providing a plurality of library candidates and, for each library candidate, providing data representing each library candidate, wherein the data includes a representation of a library spectrum; determining a representation of the similarity of the sample to each library candidate using (i) the representation of the measured spectrum; (ii) the precision state of the representation of the measured spectrum; and (iii) the representation of the library spectrum for that library candidate; determining the most likely composition of the sample based upon the determined representations of similarity of the sample to each library candidate; and displaying the most likely composition of the sample to a user.
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Brown Christopher D.
Rhodes Gregory H. Vander
Ahura Corporation
Nghiem Michael
Pandiscio & Pandiscio
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