Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-10-17
2006-10-17
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S069000, C702S106000, C324S076190, C324S076220
Reexamination Certificate
active
07124043
ABSTRACT:
A spectrum analyzer with a compensation circuitry for prevention of measurement accuracy deterioration due to local oscillators phase noise.
REFERENCES:
patent: 4918748 (1990-04-01), Shahriary et al.
patent: 6166533 (2000-12-01), Musha
patent: 6313619 (2001-11-01), Roth
patent: 6600906 (2003-07-01), Roppongi
patent: 6621277 (2003-09-01), Mar
Pantchenko Serguei
Stein Anatoli B.
Barbee Manuel L
Greenberg & Traurig, LLP
Guzik Technical Enterprises
Hoff Marc S.
Lappin Mark G.
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