Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Analysis of complex waves
Patent
1989-09-21
1992-11-10
Arana, Louis
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
Analysis of complex waves
324 78D, 364485, G01R 2316, G01R 2300
Patent
active
051627248
ABSTRACT:
A spectrum analyzer comprising various components. In the analyzer, a high-frequency signal processing circuit frequency-converts an object signal including waves recurring for a short period of time, into an intermediate-frequency signal, by using a local oscillation signal swept continuously over a desired range of frequencies, and thereby outputs a frequency spectrum of the object signal. A demodulator demodulates the frequency spectrum output by the high-frequency signal processing circuit. A selection signal supplying section supplies a selection signal for selecting that portion of the spectrum output by the demodulator, which lies waves to be analyzed. A control section outputs said portion of the spectrum output by the demodulator, in accordance with the selection signal output from the selection signal supplying section. A display displays the frequency spectrum output by the control section. A sweep control section causes the high-frequency signal processing circuit to sweep the local oscillation signal repeatedly, each time for a period which is not an integral multiple of the cycle period of the selection signal.
REFERENCES:
patent: 4611165 (1986-09-01), Nussbaum
patent: 4839582 (1989-06-01), Fukaya et al.
patent: 4890099 (1989-12-01), Takano
patent: 5038096 (1991-08-01), Obie et al.
Anritsu's New Frequency Counters Speed Up High Frequency Measurements, JEE, Apr. 1980, pp. 68-71.
French: Utilisation de l'analyseur de spectre en mode dechenche; TLE, Jan. 1984, No. 490, pp. 34-37.
Katayama Aiichi
Kon Kenichi
Oka Hiroyoshi
Takano Mitsuyoshi
Anritsu Corporation
Arana Louis
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