Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Reexamination Certificate
2008-07-08
2008-07-08
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
C356S343000
Reexamination Certificate
active
07397561
ABSTRACT:
Systems and techniques for improved spectroscopy. In some embodiments, mechanical and/or optical zoom mechanisms may be provided for monochromator systems. For example, movable detector systems allow a detector to be positioned with respect to a dispersive element in order to obtain a first resolution. The detector systems may then allow the detector to be positioned with respect to a dispersive element to obtain a second different resolution. In some embodiments, spectroscopy of a first sample region may be performed using a plurality of excitation wavelengths. Multiple detectors may be positioned to receive light associated with different ones of the plurality of excitation wavelengths.
REFERENCES:
patent: 4810091 (1989-03-01), Sullivan
patent: 5479258 (1995-12-01), Hinnrichs et al.
patent: 5638173 (1997-06-01), Smith et al.
patent: 5713364 (1998-02-01), DeBaryshe et al.
patent: 5886784 (1999-03-01), Engelhardt
patent: 5986758 (1999-11-01), Lyons et al.
patent: 6285019 (2001-09-01), Engelhardt et al.
patent: 6483103 (2002-11-01), Engelhardt et al.
patent: 6510001 (2003-01-01), Engelhardt et al.
patent: 6555811 (2003-04-01), Amos
patent: 6677566 (2004-01-01), Knebel et al.
patent: 6809815 (2004-10-01), Knebel
patent: 6903816 (2005-06-01), Nakata et al.
patent: 6914238 (2005-07-01), Engelhardt et al.
patent: 6977724 (2005-12-01), Knebel
patent: 7092086 (2006-08-01), Knebel
patent: 2004/0057047 (2004-03-01), Knebel
patent: 0 862 055 (1998-02-01), None
patent: WO 03073082 (2003-09-01), None
Giglio Bryan
Hopkins Jeffrey A.
MacPherson Kwok Chen & Heid, LLP.
Toatley , Jr. Gregory J.
WaferMasters Incorporated
LandOfFree
Spectroscopy system does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Spectroscopy system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Spectroscopy system will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2804576