Spectroscopy characterization module

Details Spectroscopy characterization module Spectroscopy characterization module

1989-09-14

1991-11-12

McGraw, Vincent P.

Optics: measuring and testing

For optical fiber or waveguide inspection

356319, 356323, G01N 2101, G01J 342

Patent

active

050642839

ABSTRACT:
A spectroscopy characterization module having a particular configuration includes a light tight housing that accepts monochromatic radiation through a first optical port and optically chopped coherent radiation through a second optical port. A material sample is held on a sample mount within the housing according to the spectroscopy characterization technique to be used. A rotatable detector mount enclosed within the housing positions a detector in different positions depending on the measurement being performed. A first one-to-one image forming mirror focuses monochromatic radiation passing through the first optical port onto the material sample. A lens focuses optically chopped radiation passing through the second optical port onto the material sample. A second one-to-one image forming mirror focuses radiation transmitted through the sample onto the detector in a first position while a third one-to-one image forming mirror focuses radiation reflected off the sample onto the detector in a second position. Various spectroscopic measurements can be performed on the material sample by merely using different sample mounts without changing the configuration of the characterization module.

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Tober et al., "Piezoreflectance Characterization of Double-Barrier Resonant Tunneling Structures," Appl. Phys. Lett., vol. 53, No. 10, Sep. 5, 1988, pp. 883-885.
Tober et al., "Piezoreflectance Characterization of Resonant Tunneling and Modulation-Doped Heterstructures," Journal of Electronic Materials, vol. 18, No. 3, 1989, pp. 379-384.
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