Optics: measuring and testing – By dispersed light spectroscopy
Reexamination Certificate
2006-11-21
2006-11-21
Lee, Hwa (Andrew) (Department: 2877)
Optics: measuring and testing
By dispersed light spectroscopy
Reexamination Certificate
active
07139071
ABSTRACT:
A spectroscopy method in which a sample is scanned without moving the sample. Light from the sample16is collected by a lens14and analyzed at a spectrum analyzer28before being focused onto a photodetector32. Light from the focal point of the lens14is brought to a tight focus on the photodetector32whilst light from in front of or behind the focal point comes to a more diffuse focus. Light from the pixels on the photodetector32corresponding to the focal point of the lens14is processed, whilst light from pixels outside this region is ignored, thus forming a ‘virtual slit’. The sample16is scanned in a vertical direction by moving the ‘virtual slit’ up and down, by changing the designated rows of pixels from which data is analyzed. The sample is scanned in a horizontal direction by moving a vertical slit24in the light path in a horizontal direction.
REFERENCES:
patent: 4407008 (1983-09-01), Schmidt et al.
patent: 5510894 (1996-04-01), Batchelder et al.
patent: 6002476 (1999-12-01), Treado
patent: 6095982 (2000-08-01), Richards-Kortum et al.
patent: 6281657 (2001-08-01), Matsuo
patent: 100 14 636 A 1 (2000-10-01), None
patent: 0 542 962 (1993-05-01), None
patent: 543 578 (1993-05-01), None
patent: 11-133306 (1999-05-01), None
patent: WO 99/58939 (1999-11-01), None
patent: WO 01/94897 (2001-12-01), None
Bennett Robert
Day John Charles Clifford
Meaden Graham Mark
Geisel Kara
Lee Hwa (Andrew)
Oliff & Berridg,e PLC
Renishaw PLC
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