Optics: measuring and testing – By polarized light examination
Reexamination Certificate
2006-01-11
2009-11-24
Toatley, Jr., Gregory J (Department: 2877)
Optics: measuring and testing
By polarized light examination
C356S369000, C702S040000, C702S085000, C702S135000
Reexamination Certificate
active
07623236
ABSTRACT:
To effectively reduce a measurement error in a parameter indicating a state of spectroscopic polarization generated by variations in retardation of a retarder due to a temperature change or other factors, while holding a variety of properties of a channeled spectroscopic polarimeter. By noting that reference phase functions φ1(σ) and φ2(σ) are obtained by solving an equation from each vibration component contained in a channeled spectrum P(σ), the reference phase functions φ1(σ) and φ2(σ) are calibrated concurrently with measurement of spectrometric Stokes parameters S0(σ), S1(σ), S2(σ), and S3(σ).
REFERENCES:
patent: 7336360 (2008-02-01), Oka et al.
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Oka, K., et. al., “Spectroscopic Polarimetry with a channeled spectrum”, Optics Letters, Optical Society of America, Washington, DC, USA, vol. 24, No. 21, pp. 1475-1477 (Nov. 1999).
Oka, K., et. al., “Singleshot spectroscopic polarimetry using channeled spectrum”, Proceedings of the SPIE—The International Society for Optical Engineering SPIE-INT. SOC. OPT. ENG USA, vol. 4919, pp. 167-175 (2002).
Sabatke D.S., et. al., “Linear calibration and reconstruction techniques for channeled spectropolarimetry”, Optics Express, Optical Society of America, vol. 11, No. 22, Abstract. pp. 2946-2947, (Nov. 2003).
Kato et al., “Measurement of Spectral Distribution of Polarized Light Based on Frequency Region Interference Method,” Preliminary Manuscript Collection for 34thAcademic Lecture Meeting of Hokkaido Branch of Japan Society of Applied Physics, p. 41, 1998.
Oka Kazuhiko
Okabe Hiroshi
Taniguchi Atsushi
Alli Iyabo S
Foley & Lardner LLP
National University Corporation Hokkaido University
OMRON Corporation
Toatley Jr. Gregory J
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