Thermal measuring and testing – Temperature measurement – In spaced noncontact relationship to specimen
Patent
1986-04-08
1988-12-13
Yasich, Daniel M.
Thermal measuring and testing
Temperature measurement
In spaced noncontact relationship to specimen
356 44, 356435, G01J 508
Patent
active
047906693
ABSTRACT:
Apparatus and method for optically measuring temperature by spectroscopically determining the temperature-induced changes in the wavelength spectrum of light interacting with a semiconductor temperature sensor. The method includes providing illumination from a radiant energy source with a broad wavelength spectrum, guiding the radiant energy to a remote semiconductor sensor, returning the radiant energy after interaction with the semiconductor sensor, and analyzing the returned wavelength spectrum to determine the temperature-induced spectral changes due to the absorption edge of the semiconductor sensor. One embodiment of the invention comprises a quartz-halogen lamp, an optical multiplexer, optical fiber lightguides, a gallium arsenide semiconductor sensor, a fast scan spectrometer, an analog to digital converter and a microprocessor for processing the information of the returned wavelength spectrum for determining and displaying the sensor temperature.
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CV Technology, Inc.
Yasich Daniel M.
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