Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Reexamination Certificate
2006-03-14
2008-09-16
Lauchman, L. G (Department: 2877)
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
C356S330000, C365S120000, C365S106000
Reexamination Certificate
active
07426028
ABSTRACT:
Optical breakdown by predetermined laser pulses in transparent dielectrics produces an ionized region of dense plasma confined within the bulk of the material. Such an ionized region is responsible for broadband radiation that accompanies a desired breakdown process. Spectroscopic monitoring of the accompanying light in real-time is utilized to ascertain the morphology of the radiated interaction volume. Such a method and apparatus as presented herein, provides commercial realization of rapid prototyping of optoelectronic devices, optical three-dimensional data storage devices, and waveguide writing.
REFERENCES:
patent: 4466080 (1984-08-01), Swainson et al.
patent: 6998214 (2006-02-01), Fourkas et al.
patent: 2007/0086309 (2007-04-01), Yang
Tong et al, Real-time control of ultrafast laser micromachining by laser-induced breakdown spectroscopy, Mar. 2004, Applied Optics, vol. 43, No. 9, pp. 1971-1980.
Schaffer et al, “Morphology of Femtosecond Laser-Induced Structural Changes in Bulk Transparent Materials.” Applied Physics Letters, vol. 84, No. 9, Mar. 1, 2004. @2004 American Institute of Physics.
C.W. Carr, “Experimental Studies of Laser-Induced Breakdown in Transparent Dielectrics.” Sep. 23, 2003. UCRL-LR-155392 Thesis.
Carr Christopher W.
Demos Stavros
Feit Michael D.
Rubenchik Alexander M.
Lauchman L. G
Lawrence Livermore National Security LLC
Lee John H.
Staggs Michael C.
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