Spectroscopic diagnostic methods and system based on...

Chemical apparatus and process disinfecting – deodorizing – preser – Analyzer – structured indicator – or manipulative laboratory... – Means for analyzing liquid or solid sample

Reexamination Certificate

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C422S082090

Reexamination Certificate

active

10347134

ABSTRACT:
The present invention provides systems and methods for the determination of the physical characteristics of a structured superficial layer of material using light scattering spectroscopy. The light scattering spectroscopy system comprises optical probes that can be used with existing endoscopes without modification to the endoscope itself. The system uses a combination of optical and computational methods to detect physical characteristics such as the size distribution of cell nuclei in epithelial layers of organs. The light scattering spectroscopy system can be used alone, or in conjunction with other techniques, such as fluorescence spectroscopy and reflected light spectroscopy.

REFERENCES:
patent: 4497577 (1985-02-01), Sato et al.
patent: 4541719 (1985-09-01), Wyatt
patent: 4768879 (1988-09-01), McLachlan et al.
patent: 5151909 (1992-09-01), Davenport et al.
patent: 5303026 (1994-04-01), Strobl et al.
patent: 5636637 (1997-06-01), Guiolet et al.
patent: 5940425 (1999-08-01), Lasser et al.
patent: 6006001 (1999-12-01), Alfano et al.
patent: 6028622 (2000-02-01), Suzuki
patent: 6212425 (2001-04-01), Irion et al.
patent: 6217510 (2001-04-01), Ozawa et al.
patent: 6293911 (2001-09-01), Imaizumi et al.
patent: 6422994 (2002-07-01), Kaneko et al.
patent: 6462770 (2002-10-01), Cline et al.
patent: 2002/0007123 (2002-01-01), Balas
patent: 2002/0035330 (2002-03-01), Cline et al.
patent: 2002/0049366 (2002-04-01), Kehr
patent: 2002/0077677 (2002-06-01), Beck et al.
patent: 227044 (1985-09-01), None
patent: 0 590 268 (1994-04-01), None
patent: 173020 (1984-11-01), None
patent: 7250812 (1995-10-01), None
patent: 8224209 (1996-09-01), None
patent: 8224210 (1996-09-01), None
patent: 8252218 (1996-10-01), None
patent: 200097859 (2000-04-01), None
patent: 2002095624 (2002-04-01), None
patent: WO 96/05693 (1996-02-01), None
patent: WO 96/42006 (1996-12-01), None
patent: WO 00/19889 (2000-04-01), None
patent: WO 00/43750 (2000-07-01), None
patent: WO 01/34031 (2001-05-01), None
patent: WO 02/07587 (2002-01-01), None
“Diode Lasers”, http://repairfaq.ece.drexel.edu/sam/laserdio.htm.
Li et al. “New Thin Film Polarizing Beamsplitter”, 1998, http://www.sspectra.com/designs/ftr—polar.html.

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