Spectroscopic analysis technique for measuring the amount of...

Details Spectroscopic analysis technique for measuring the amount of... Spectroscopic analysis technique for measuring the amount of...

2006-06-22

2009-02-24

Punnoose, Roy M (Department: 2886)

Optics: measuring and testing

By monitoring of webs or thread

C356S430000

Reexamination Certificate

active

07495766

ABSTRACT:
In accordance with the present application, a method and system is provided for measuring an amount of surface material on a wire. A section of the wire and a beam generating device configured to generate a high energy beam are placed in a positional relationship with each other. The relationship permits a high energy beam generated from the beam generating device to impinge upon a location on the section of the wire. A reflected beam from the high energy beam is reflected from the section of the wire and is detected by a detector positioned at a location to receive the reflected beam. The beam received by the detector is investigated to determine the characteristics of the surface material on the wire.

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PerkinElmerSCIEX Instruments, “ICP Mass Spectrometry, The 30-Minute Guide to ICP-MS”, 2001 PerkinElmer, Inc., 8 pgs.

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