Spectroscope confocal optical system using the same, and...

Details Spectroscope confocal optical system using the same, and... Spectroscope confocal optical system using the same, and...

2006-10-24

2006-10-24

Lee, Hwa (Andrew) (Department: 2877)

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

C356S328000

Reexamination Certificate

active

07126684

ABSTRACT:
A spectroscope is provided with a point light source which emits a dispersed light having a plurality of wavelengths, a first optical system which collimates the dispersed light which is emitted from the point light source into an approximate parallel light flux, a dispersing element which disperses the approximate parallel light flux, and a second optical system for condensing the dispersed light flux near a focal plane. Aberrations for a plurality of wavelengths of an off-axial light flux are compensated in the second optical system. By doing this, it is possible to provide a spectroscope which has a high wavelength resolution.

REFERENCES:
patent: 6081332 (2000-06-01), Kojima
patent: 6555811 (2003-04-01), Amos

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