Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1994-02-07
1995-08-15
McGraw, Vincent P.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356300, G01J 328, G01O 332
Patent
active
054424402
ABSTRACT:
A spectroscope or spectrometer for detecting a driving position of a main wavelength dispersive device using a diffraction line produced in that light from a light source having a narrow wavelength bandwidth is incident on a sub-wavelength dispersive device in an arrangement that a plane diffraction grating is used as the sub-wavelength dispersive device which is affixed on a driving axis in a manner of forming a suitable angle with the main wavelength dispersive device. When the main wavelength dispersive device is used between 0.degree. and 90.degree. , a diffraction angle of the sub-wavelength dispersive device comes within about 45.degree. . In such a range, the angular dispersion is not changed significantly, thus the interval between diffraction lines is hardly varied. For this reason, the width of a sub-detector can always be set at an optimum condition for raising the positional detecting accuracy while one or more diffraction lines are allowed to be incident.
REFERENCES:
patent: 3385160 (1968-05-01), Dawson et al.
patent: 4191473 (1980-03-01), Hansch
Denton et al, "Charge-Injection and Charge Coupled devices in Practical Chemical Analysis," 1983, American Chemical Society.
Hantis K. P.
McGraw Vincent P.
Seiko Instruments Inc.
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