Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1985-10-15
1989-09-19
Evans, F. L.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356334, 364498, G01J 318
Patent
active
048675636
ABSTRACT:
To provide sufficient sensitivity, spectral resolution and speed of measurement for field environmental measurements in a portable spectroradiometer, a silicon photodiode receives light: (1) having a bandwidth in the range of between 2 and 15 nm (nanometers) from a pivotable concave holographic diffraction grating within the wavelength range of between 250 and 1150 nm at a scanning rate in the range of 20 to 100 nm per second; (2) having stray light of high intensity and undesired frequencies and the shorter wavelength harmonics of the selected frequency range blocked by filters; and (3) having flux of at least 10 microwatts per square meter of diffuser plate for each nanometer of bandwidth. Automatic electrical zeroing is obtained by blocking all light once at the beginning of each scan, obtaining an electrical drift-related signal and using the drift signal to adjust the measured signal during the scan. Several different sensing interfaces can be used, including a quartz, light fiber probe having at least a 50% packing density and a cone angle of at least 24 degrees. The data and the programming storage is at least 30K bytes but the instrument uses no more than watts of power when the instrument is not scanning.
REFERENCES:
Brown et al., Canadian Journal of Remote Sensing, vol. 6, No. 1, Jul. 1980, pp. 26-37.
Myrabo et al., Applied Optics, vol. 21, No. 15, Aug. 1, 1982, pp. 2855-2858.
Biggs William W.
Middendorf Lyle R.
Wurm John H.
Carney Vincent L.
Evans F. L.
Li-Cor Inc.
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