Optics: measuring and testing – With sample preparation – Depositing particles on optical surface
Patent
1992-05-12
1998-07-07
Warden, Robert J.
Optics: measuring and testing
With sample preparation
Depositing particles on optical surface
250341, G01N 100
Patent
active
057777268
ABSTRACT:
A system for detecting the presence of contaminants in a flowing stream of supercritical fluid. A sample stream is removed from a flowing stream of supercritical fluid and subjected to reduced pressure in a contaminant measurement zone. The supercritical fluid turns into gas at the reduced pressure with the contaminants remaining in a non-gaseous form. An attenuated total reflectance plate is used to spectrophotometrically detect the presence of the non-gaseous contaminants which deposit on the surface of the plate within the contaminant measurement zone. The system is useful for spectrophotometrically detecting the presence and identity of contaminants in supercritical fluids and is useful in monitoring both cleaning processes and extraction processes.
REFERENCES:
patent: 4568447 (1986-02-01), Pujado et al.
patent: 4608344 (1986-08-01), Carter et al.
patent: 4818710 (1989-04-01), Sutherland et al.
patent: 5068040 (1991-11-01), Jackson
patent: 5082629 (1992-01-01), Burgess, Jr. et al.
patent: 5165005 (1992-11-01), Klainer et al.
patent: 5213619 (1993-05-01), Jackson et al.
Grandprie et al, "Thin Film Planar Waveguide Sensor for Liquid Phase Absorbance Measurements," Analytical Chemistry, vol. 62, No. 18, Sep. 15, 1990.
Alkov Leonard A.
Dawson L.
Lenzen, Jr. Glenn H.
Raytheon Company
Warden Robert J.
LandOfFree
Spectrophotometric supercritical fluid contamination monitor does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Spectrophotometric supercritical fluid contamination monitor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Spectrophotometric supercritical fluid contamination monitor will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1211832