Spectrophotometer for accurately measuring light intensity in a

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356319, 356328, G01J 328

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active

053052331

ABSTRACT:
A spectrophotometer utilizes a band-pass filter array for splitting incident light into a plurality of light components of different wavelengths, a plurality of silicon photodiodes for receiving the respective light components, and a memory for storing spectral sensitivity information. The spectral sensitivity information is obtained by integrating the spectral sensitivities of spectrodetectors relative to each sectionalized wavelength regions sectionally generated from a measurement wavelength region. Each of the spectrodetectors include a band-pass filter array and a silicon photodiode in combination. A central processing unit calculates simultaneous equations representing the relation between the output from each of the silicon photodiodes, the spectral sensitivity information stored in memory and the light intensity of the sectionalized wavelength region, to obtain the light intensity.

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patent: 4560275 (1985-12-01), Goetz
patent: 4568186 (1986-02-01), Yoshimura et al.
patent: 4669880 (1992-06-01), Nelson et al.
patent: 4685071 (1987-08-01), Lee
patent: 4703437 (1987-10-01), Nishimura
Color: Theory and Imaging Systems, Dr. Gunther Wyszechi, 1973 Society of Photographic Scientists and Engineers, Wash. D.C. pp. 24-29.
Chroma Meter CR-100/CR-110, Operational Manual, Minolta 1984, Japan.
Waveform Data Processing for the Scientific Measurement, Shigeo Minami, Chapter 7, issued Apr. 30, 1986; pp. 122-131.

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