Spectrophotometer

Optics: measuring and testing – By dispersed light spectroscopy – With background radiation comparison

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Details

356323, G01J 342

Patent

active

042994853

ABSTRACT:
A dual beam spectrophotometer includes signal processing circuitry for producing sample-dark and reference-dark signals. The dark signals substracted from the sample and reference signals are the average of the dark signals produced on each side of the sample and reference pulses. The signal processing circuitry may comprise four sample and hold circuits which store the sample signal, reference signal and first and second dark signals, a resistive combining network for the two dark signals and first and second substractor circuits. The first substractor circuit provides the sample-dark signal at its output while the second substractor circuit provides the reference-dark signal at its output.

REFERENCES:
patent: 3497302 (1970-02-01), Tipotsch
patent: 3711708 (1973-01-01), Dolin et al.
patent: 4030829 (1977-06-01), Hooper

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