Optics: measuring and testing – By dispersed light spectroscopy – With background radiation comparison
Patent
1980-02-27
1981-11-10
Evans, F. L.
Optics: measuring and testing
By dispersed light spectroscopy
With background radiation comparison
356323, G01J 342
Patent
active
042994853
ABSTRACT:
A dual beam spectrophotometer includes signal processing circuitry for producing sample-dark and reference-dark signals. The dark signals substracted from the sample and reference signals are the average of the dark signals produced on each side of the sample and reference pulses. The signal processing circuitry may comprise four sample and hold circuits which store the sample signal, reference signal and first and second dark signals, a resistive combining network for the two dark signals and first and second substractor circuits. The first substractor circuit provides the sample-dark signal at its output while the second substractor circuit provides the reference-dark signal at its output.
REFERENCES:
patent: 3497302 (1970-02-01), Tipotsch
patent: 3711708 (1973-01-01), Dolin et al.
patent: 4030829 (1977-06-01), Hooper
Barlow Derek
Perkins Charles V.
Briody Thomas A.
Evans F. L.
Mayer Robert T.
Miller Paul R.
Pye Electronic Products Limited
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