Spectrometric optical method and system providing required...

Details Spectrometric optical method and system providing required... Spectrometric optical method and system providing required...

2005-11-16

2011-11-01

Evans, F. L. (Department: 2877)

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

Reexamination Certificate

active

08049882

ABSTRACT:
A system and method for use in spectrometric measurements of an article using selecting an optimal integration time range of the light detection system during which the measurement is to be applied, the optimal integration time being that at which a required value of signal to noise ratio (SNR) of the measurements is obtainable.

REFERENCES:
patent: 4253765 (1981-03-01), Kato et al.
patent: 4330209 (1982-05-01), Hashimoto et al.
patent: 4674880 (1987-06-01), Seki
patent: 5879294 (1999-03-01), Anderson et al.

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