Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation
Patent
1994-10-19
1996-01-09
McGraw, Vincent P.
Optics: measuring and testing
By dispersed light spectroscopy
With sample excitation
356319, 356328, G01J 330, G01N 2173
Patent
active
054833370
ABSTRACT:
An atomic emission spectrometer includes an induction coupled plasma generator and a detector system for detecting the radiation relative to spectral wavelength. A first mirror is on the longitudinal axis of the generator to receive axial radiation therefrom. A second mirror is disposed laterally from the generator so as to reflect radial radiation therefrom parallel to the longitudinal axis toward a third mirror disposed laterally from the longitudinal axis. The third mirror passes the radiation to a fourth mirror positioned adjacent to the axial radiation without interfering therewith so as to reflect the radial radiation to the first mirror. The first mirror is rotated to a first orientation to reflect the axial radiation into the detector system, or to a second orientation to reflect the radial radiation into the detector system.
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Barnard Thomas W.
Crockett Michael I.
Hucks Michael W.
Grimes Edwin T.
Hantis K. P.
Ingham Herbert S.
McGraw Vincent P.
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