Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Reexamination Certificate
2007-01-30
2007-01-30
Evans, F. L. (Department: 2877)
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
C385S037000, C398S087000
Reexamination Certificate
active
10528521
ABSTRACT:
A spectrometer using a diffraction grating includes a light-incident portion including an incident-side optical waveguide emitting a light beam that includes a plurality of wavelength components and that approximates a Gaussian beam, and a collimating lens that is arranged on an emission side of the incident-side optical waveguide and that converts the light beam approximating a Gaussian beam that is emitted from the incident-side optical waveguide into a substantially collimated light beam; a diffraction grating having grooves on its surface, on which the light beam that has been converted into the substantially collimated light beam by the collimating lens is incident, the diffraction grating spectrally separating the light beam by emitting light beams whose emission direction depends on their wavelength; and a light-emitting portion having a plurality of focusing lenses that respectively condense the light beams that have been spectrally separated by the diffraction grating.
REFERENCES:
patent: 6084695 (2000-07-01), Martin et al.
patent: 56-26706 (1979-08-01), None
patent: 60-230608 (1985-11-01), None
patent: 1-281411 (1989-11-01), None
patent: 10-300976 (1998-11-01), None
J. Koyama, et al., “Optical Wave Electronics”, Corona Publishing Co., Ltd., Tokyo, 1978, chapter 4, pp. 98-101 and 132 (partial translation).
Kittaka Shigeo
Nakazawa Tatsuhiro
Nishii Junji
Oya Kazuaki
Tsunetomo Keiji
Evans F. L.
National Institute of Advanced Industrial Science and Technology
Nippon Sheet Glass Company Limited
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