Spectrometer system for optical reflectance measurements

Details Spectrometer system for optical reflectance measurements Spectrometer system for optical reflectance measurements

2007-07-17

2007-07-17

Evans, F. L. (Department: 2877)

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrophotometer

C356S326000, C315S307000

Reexamination Certificate

active

11113347

ABSTRACT:
A spectrometer system includes a thermal light source for illuminating a sample, where the thermal light source includes a filament that emits light when heated. The system additionally includes a spectrograph for measuring a light spectrum from the sample and an electrical circuit for supplying electrical current to the filament to heat the filament and for controlling a resistance of the filament. The electrical circuit includes a power supply that supplies current to the filament, first electrical components that sense a current through the filament, second electrical components that sense a voltage drop across the filament, third electrical components that compare a ratio of the sensed voltage drop and the sensed current with a predetermined value, and fourth electrical components that control the current through the filament or the voltage drop across the filament to cause the ratio to equal substantially the predetermined value.

REFERENCES:
patent: 4030829 (1977-06-01), Hooper
patent: 4464051 (1984-08-01), Talmadge et al.
patent: 5042948 (1991-08-01), Fletcher
patent: 5184193 (1993-02-01), LeFebre
patent: 5652654 (1997-07-01), Asimopoulos
patent: 6002477 (1999-12-01), Hammer

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