Optics: measuring and testing – By dispersed light spectroscopy – With background radiation comparison
Reexamination Certificate
2007-03-02
2008-12-30
Evans, F. L (Department: 2877)
Optics: measuring and testing
By dispersed light spectroscopy
With background radiation comparison
C356S301000, C356S326000
Reexamination Certificate
active
07471390
ABSTRACT:
A spectrometer collects background spectra during the idle time in which it is not collecting spectra from a sample. These spectra are collected over a range of exposure times, allowing the background reading on each pixel to be modeled as a function of exposure time. When sample spectra are then collected, the exposure time for the sample spectra can be used with the modeled function to compute an estimated background within the sample spectra. The estimated background can then be subtracted from the sample spectra, thereby reducing the noise therein.
REFERENCES:
patent: 5272518 (1993-12-01), Vincent
patent: 6974973 (2005-12-01), Rossi et al.
patent: 2004/0170215 (2004-09-01), Rossi et al.
patent: 2007/0216900 (2007-09-01), Dalrymple
Dalrymple David L.
Deck Francis J.
Wieboldt Richard C.
DeWitt Ross & Stevens
Evans F. L
Staggs Michael C.
Thermo Electron Scientific Instruments LLC
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