Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1997-10-28
1999-03-09
Kim, Robert
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356329, G01J 328
Patent
active
058808337
ABSTRACT:
An optical spectrum measuring apparatus is disclosed which is able to accurately measure the optical spectrum without an influence and to measure the light intensity per unit frequency without an influence of the change of the bandwidth of the wavelength because of the measured wavelength. The diffraction grating 4 emits the diffracted light with an appropriate wavelength corresponding to the incident angle after diffracting the parallel light. The outgoing light slit 6 passes the diffracted light with a length shorter than the slit width. The AD converter 9 measures the intensity of the diffracted light passed through the outgoing light slit 6. CPU 12 controls the incident angle and the width of the slit. The memory of the bandwidth of the wavelength 14 stores the bandwidth of the passed wavelength and the measured light intensity is adjusted with the bandwidth of the passed wavelength. Also the bandwidth of the passed wavelength is converted to the frequency and the measured light intensity is adjusted by the bandwidth of passed wave frequency.
REFERENCES:
patent: 5192981 (1993-03-01), Slutter et al.
patent: 5276499 (1994-01-01), Minakawa et al.
Ando Electric Co. Ltd.
Kim Robert
LandOfFree
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