Spectrometer

Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation

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G01N 2173

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active

044326440

ABSTRACT:
A fluorescence spectrometer for multielement analysis including a source for atomizing a dispersed sample along an axis and a plurality of energizers and detectors preferably arranged in pairs about the source, with each of the pairs designed for analyzing one element. Preferably, the source is an inductively coupled plasma.
Means is provided for each of the pairs to view a different segment of the source along its axis, depending on the element to be analyzed. Preferably, such means includes: a source movable along its axis; fiber optics interposed between the energizers and the source and between the source and the detectors; and a movable optical element interposed between the energizers and the source and between the source and the detectors.
The spectrometer further features a polychromator for use in lieu of matched optical filters in the detectors and demountable hollow cathode lamps as energizers.

REFERENCES:
patent: 2847899 (1958-08-01), Walsh
patent: 3428401 (1969-02-01), Buzza
patent: 3600571 (1971-08-01), Chisholm et al.
patent: 3619061 (1971-11-01), Mitchell
patent: 3699383 (1972-10-01), Chaney
patent: 3958883 (1976-05-01), Turner
patent: 3963351 (1976-06-01), Chance et al.
patent: 4144452 (1979-03-01), Harte
patent: 4300834 (1981-11-01), Demers et al.
patent: 4326802 (1982-04-01), Smith, Jr. et al.
Measures et al., "Analyzing Fluorescence Decay", Laser Focus, Nov. 1974, pp. 49-52.
Mitchell et al., "Simultaneous Multielement Analysis Using Sequentially Excited Atomic Fluorescence Radiation", 5 Spectrochimica Acta, (1970), vol. 25B, No. 4, pp. 175-182.
A. Montaser & V. A. Fassel, "Inductively Coupled Plasmas as Atomization Cells . . . ", Analytical Chemistry, vol. 48, No. 11, (Sep. 1976), pp. 1490-1499.
V. A. Fassel, "Quantitative Elemental Analyses by Plasma Emission Spectroscopy," Science, vol. 202, Oct. 13, 1978, pp. 183-191.
V. A. Fassel & R. N. Kniseley, "Inductively Coupled Plasmas-Optical Emission Spectroscopy," Analytical Chemistry, vol. 46, No. 13, (Nov. 1974), pp. 1110A-1120A.
V. A. Fassel & R. N. Kniseley, "Inductively Coupled Plasmas," Analytical Chemistry, vol. 46, (Nov. 1974), pp. 1155A-1164A.
D. G. Mitchell, "Simultaneous Multi-Element Analysis by Atomic Fluorescence Spectroscopy," Technicon Int'l. Congress, Nov. 2-4, 1970, N.Y.C.
Kornblum et al., Spectrochimica Acta, vol. 29B, No. 9-10, Sep.-Oct. 1974, pp. 249-261.
Busch et al., Analytical Chemistry, vol. 51, No. 6, May 1979, pp. 670-673.

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