Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1989-06-22
1991-01-08
Evans, F. L.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
355 53, 372 32, 372 57, G01J 318
Patent
active
049830392
ABSTRACT:
A spectrometer is disclosed, in which plural entrance slits are mounted, and a reference light passing through one entrance slit and the light to be measured passing through the other entrance slit are simultaneously focused on a photo-sensitive surface of a detector through a diffraction grating and a focusing optical system, to measure the wavelength of the light to be measured precisely by using the reference light as a standard.
REFERENCES:
patent: 3171882 (1965-03-01), Baird
patent: 3229566 (1966-01-01), Hutchinson et al.
patent: 3522739 (1970-08-01), Coor et al.
patent: 3846024 (1974-11-01), Turner
patent: 4191473 (1980-03-01), Hansch
patent: 4823354 (1989-04-01), Znotins et al.
patent: 4829533 (1989-05-01), Hallberg et al.
Fredrikson, The Review of Scientific Instruments, vol. 44, No. 1, Jan. 1973, pp. 52-55.
Optical Technology Handbook, 1980, pp. 1066-1067.
Harada Tatsuo
Kita Toshiaki
Kurosaki Toshiei
Terasawa Tsuneo
Evans F. L.
Hitachi , Ltd.
LandOfFree
Spectrometer does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Spectrometer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Spectrometer will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-930772