Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1991-11-18
1993-08-10
McGraw, Vincent P.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356328, 356305, G01J 328
Patent
active
052354024
ABSTRACT:
In a spectrometer using a two dimensional CCD array as a detector a column or a substantial part of a column of pixels is used to detect radiation of a given wavelength. The output circuit (52) of the CCD is modified by taking the drain electrode of the pixel reset transistor (T1) to the reference voltage (VR) via a further transistor (T3) which is controlled by a column reset signal applied to input (63). A further capacitor (C2) is connected in parallel with the internal binning capacitor (C1) through transistor (T1). Since the further capacitor (C2) is "off chip" it can be made much larger than the binning capacitor (C1) thus allowing a whole column of pixels to be binned enabling a reduction in read-out noise.
REFERENCES:
patent: 4004163 (1977-01-01), Spence
"Optimizing Charge-Coupled Device Detector Operation for Optical Astronomy" Optical Engineering, Oct. 1987, vol. 26 No. 10, pp. 1061-1066.
"Intensified Charge-Coupled Device Cameras for a Spatially Resolving Extreme Ultraviolet Spectrometer" Optical Engineering, Aug. 1987, vol. 26, No. 8 pp. 806-812.
"Charge Transfer Device Detectors for Analytical Optical Spectroscopy--Operation and Characteristics" Applied Spectroscopy, vol. 41, Nov. 1987 pp. 1114-1125.
Botjer William L.
Hantis K. P.
McGraw Vincent P.
U.S. Philips Corp.
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