Spectrograph for an extended spectral field in which partial pla

Details Spectrograph for an extended spectral field in which partial pla Spectrograph for an extended spectral field in which partial pla

1978-06-30

1980-03-04

Evans, F. L.

Optics: measuring and testing

By dispersed light spectroscopy

For spectrographic investigation

350 370, 350162R, G01J 318

Patent

active

041914740

ABSTRACT:
A spectrograph for an extended spectral field having an inlet slot for defining a source of light to be analyzed and a dispersive system constituted by a concave holographic grating which has recording points with coordinates in relation with the coordinates of the light source to be analyzed to produce for each of respective bands of wavelengths, which in total cover the entire range of wavelengths of the spectral field to be analyzed, tangential focal lines for different wavelengths which are disposed in the same plane. The concave holographic grating is rotatable around an axis passing through the center of the grating and perpendicular to a plane passing through the center of the inlet slot so that the respective partial plane diffraction spectra are successively formed in the same plane when rotating the grating around its axis.

REFERENCES:
patent: 3011391 (1961-12-01), Fastie
patent: 4087183 (1978-05-01), Passereau

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