Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2011-01-18
2011-01-18
Barbee, Manuel L (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S067000, C324S076190
Reexamination Certificate
active
07873486
ABSTRACT:
A spectrogram mask trigger is generated in response to multiple or complex frequency events within a signal being monitored. A sequence of frequency masks over a period of time is generated according to a frequency trajectory, frequency hops or other complex frequency events expected in the signal to form a spectrogram mask. The spectrogram mask is then applied to multiple spectra or spectrogram of the signal to determine whether an anomalous frequency event has occurred within the time period or to identify a particular frequency pattern within the signal. Depending upon the results of the spectrogram mask application, the spectrogram mask trigger is generated for storing a block of data from the signal surrounding the triggering event for further analysis.
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Tektronix-Japan Brochure of the RSA3300A/RSA2200A; Published Apr. 2004. (English translation attached).
Barbee Manuel L
Gray Francis I.
Nelson Michael A.
Tektronix Inc.
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