Spectral imaging for vertical sectioning

Details Spectral imaging for vertical sectioning Spectral imaging for vertical sectioning

2006-09-19

2006-09-19

Turner, Samuel A. (Department: 2877)

Optics: measuring and testing

By light interference

C356S512000

Reexamination Certificate

active

07110118

ABSTRACT:
A method and apparatus for performing optical microscopy in one to three dimensions employs a spectral self-interference fluorescent microscopy technique that includes providing at least one fluorescent microscopy sample, at least one objective lens, and at least one reflecting surface. The fluorescent sample is disposed between the objective lens and the reflecting surface, the distance from the sample to the reflecting surface being several to several tens times an excitation wavelength. Excitation light causes the fluorescent sample to emit light, at least a portion of which is reflected by the reflecting surface. The objective lens collects the reflected light and the light emitted directly by the fluorescent sample. The direct and reflected light interfere causing spectral oscillations in the emission spectrum. The periodicity and the peak wavelengths of the emission spectrum are spectroscopically analyzed to determine the optical path length between the fluorescent sample and the reflecting surface.

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