Spectral analysis measurement apparatus and method of...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

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C702S069000, C702S074000, C702S075000, C455S423000

Reexamination Certificate

active

06882946

ABSTRACT:
A measuring apparatus includes a spectrum analysis unit having an input for receiving an input signal to be measured. The input signal includes a carrier signal located within a predetermined band of frequencies and the spectrum analysis unit is arranged to store a set of user definable parameters including the location of the carrier signal within the predetermined band of frequencies, and to use the set of user definable parameters to measure a quantity associated with the carrier signal.

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patent: 20030013409 (2003-01-01), Buckshaw
patent: 0977384 (2000-02-01), None
U.S. Appl. 60/273,987.

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