Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-04-19
2005-04-19
Wachsman, Hal (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S069000, C702S074000, C702S075000, C455S423000
Reexamination Certificate
active
06882946
ABSTRACT:
A measuring apparatus includes a spectrum analysis unit having an input for receiving an input signal to be measured. The input signal includes a carrier signal located within a predetermined band of frequencies and the spectrum analysis unit is arranged to store a set of user definable parameters including the location of the carrier signal within the predetermined band of frequencies, and to use the set of user definable parameters to measure a quantity associated with the carrier signal.
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U.S. Appl. 60/273,987.
Agilent Technologie,s Inc.
Wachsman Hal
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